Use of Surface Analysis Methods to Probe the Interfacial Chemistry of Adhesion

Abstract

This chapter explores the manner in which the surface analysis methods of X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) can be used to extract information regarding the interfacial chemistry of adhesion from polymer/metal systems such as adhesive joints. It will be shown that the analysis of a failure interface is an uncertain method to extracting interface chemistry but in certain situations, where a very thin layer of polymer remains on the metal oxide surface, this provides spectra characteristic of the interphase. In most situations, some form of chemical or mechanical sectioning is necessary, and microtomy and dissolution methods are described as ways in which chemical information at high depth resolution can be extracted from the interphase zone.